The D.I.R.T.^® III Series of Microscope Imaging Systems combines a superior optical system offering crisp clear images even at high magnification, with all the tools necessary for viewing coating defects, and film builds.

Using the integrated X/Y Measuring Stage and digital micrometer heads, users can easily take repeatable accurate film build measurements or, using the on-line imaging system, take measurements and export those directly to Microsoft Excel for further analysis.

Using a variety of lighting techniques including Brightfield, darkfield, Polarized, DIC Nomarski and oblique illumination, operators can readily view the same sample and see different attributes increasing the likelihood of solving problems faster.

Does your application call for specially designed systems? Not a problem, custom system design is our specialty. If you already have a microscope or video system we can easily retrofit most microscope systems to utilize the Microview imaging system.

• Triocular eyepiece tube supports CF eyepiece lenses and a port for video hook-up
• Magnifies from 20x up to 4000x
• Film build measurements to 0.00005" or 1 micron
• High resolution RGB color video imaging system
• Modular system customizable to meet users unique requirements
• Fully integratable w/ the D.I.R.T. Library^® software and Microview Image Analysis Software
• Coaxial coarse and fine focusing
• Variety of observation techniques are available including Brightfield observation, Darkfield observation, Polarized and (DIC) Nomarski Observation

The complete "turnkey" system includes:

• Compound Metallurgical Microscope System
• Manual X/Y Measurement Stage & Micrometer Heads
• High Resolution RGB Video Imaging System
• IBM Pentium Computer System
• Image Analysis Software
• The Dirt Library^® Visual Database
• High Resolution Color Laser Printer
• On-Site Setup & Configuration
• User Training with Standard Operating Procedures

Other configurations include:

BACK